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Inspection Equipment
  • 蛍光X線膜厚計
                       
    XRF coating thickness gauge
    Manufacturer / Model Hitachi High-Tech Analysis Corporation
    FT150h
    Application A general-purpose film thickness gauge capable of measuring the thickness and composition of multilayer plating and alloy films with high precision.
    Supports plating thickness measurement for multilayer films of three or more layers and for microscopic areas.
  • 蛍光X線分析装置
    XRF coating thickness gauge
    Manufacturer / Model Hitachi High-Tech Analysis Corporation
    FT100A
    Application A general-purpose film thickness gauge capable of measuring the thickness and composition of multilayer plating and alloy films with high precision.
    Supports plating thickness measurement for films of up to two layers.
  • 蛍光X線分析装置
    XRF Analyzer
    Manufacturer / Model Hitachi High-Tech Analysis Corporation
    EA1400
    Application An analyzer capable of measuring trace elements contained in samples, including RoHS substances.
    Enables highly accurate analysis for a wide range of applications, such as elemental identification of foreign contaminants.
  • CNC画像測定機
    CNC Vision Measuring System
    Manufacturer / Model Mitutoyo Corporation
    QV-X404T1C-E
    Application A system capable of non-contact 3D shape measurement over a wide range of 400 × 400 × 250 mm.
    Also supports dimensional measurement of complex-shaped workpieces with high repeatability accuracy.
  • 画像寸法測定器
    Image Dimension Measuring System
    Manufacturer / Model KEYENCE Corporation
    IM-7000
    Application An image dimension measuring system capable of simultaneously measuring multiple dimensions without contact.
  • 高さ・平面度測定機
    Height / Flatness Measuring System
    Manufacturer / Model KEYENCE Corporation
    HM-1200
    Application A height and flatness measuring system that can quantify surface height distribution and flatness without contact.
  • 微小面分光色差計
    Micro Spectrophotometer
    Manufacturer / Model Nippon Denshoku Industries Co., Ltd.
    VSS-7700
    Application A micro area spectrophotometric colorimeter capable of highly accurate evaluation of spectral reflectance and color difference over a wide range.
    Also supports measurement of glossiness and spectral transmittance on metal-plated surfaces.
  • Digital Micrometer
    Manufacturer / Model Nikon Corporation
    MU-501U
    Application Enables contact measurement of thickness, step height, and similar features of compact precision instruments and electronic components.
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